通过先进的测试和自动化加速硅光子态开发

Overview

This Webinar describes Luna's advanced approach to silicon photonics testing and Maple Leaf Photonics' modular and flexible platform for automated testing of dies, and how these two technologies integrate into an effective complete solution for silicon photonics. The presenters will show how, with fast and precise device characterization technology and intelligent probe station techniques, you can assess design and fabrication fidelity early in the manufacturing process, even before wafer completion.

与会者将学习如何将这些阶段扩展到后端处理，光学子组件和组件表格中的各个阶段，以加快开发周期并消除非增值活动。

关键的外卖

• Learn the importance and unique challenges of silicon photonics test at wafer, die and subassembly levels
• Understand how to perform fast and detailed all-parameter device characterization using Luna's OBR and OVA technologies
• 完全在制造和开发周期中完全表征您的复杂E-O设计，以识别产量限制，性能边距，FAB错误和其他缺陷
• 快速学习并调整您的测试协议，以揭示在操作中表达您设计的最重要的属性，并保证维护制造公差

主持人

• Luna Innovations高级副总裁兼总经理Brian J.Soller
• B. Roe Hemenway, Ph.D., Chief Technical Officer, Maple Leaf Photonics